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X-Ray Absorption Fine Structure for Catalysts and Surfaces
Contributor(s): Iwasawa, Yasuhiro (Editor)

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 ISBN: 9810223234     ISBN-13: 9789810223236
Publisher: World Scientific Publishing Company
OUR PRICE: $146.30  

Binding Type: Hardcover
Published: May 1996
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Temporarily out of stock - Will ship within 2 to 5 weeks

Click for more in this series: Synchrotron Radiation Techniques and Applications
Additional Information
BISAC Categories:
- Science | Chemistry - Physical & Theoretical
- Science | Physics - General
- Technology & Engineering | Materials Science - General
Dewey: 541.395
LCCN: 96000952
Series: Synchrotron Radiation Techniques and Applications
Physical Information: 1.13" H x 6.44" W x 8.89" L (1.58 lbs) 428 pages
 
Descriptions, Reviews, Etc.
Publisher Description:
X-ray absorption fine structure (XAFS) is a powerful technique in characterization of structures and electronic states of materials in many research fields including, e.g., catalysts, semiconductors, optical ingredients, magnetic materials, and surfaces. This characterization technique could be applied in a static or a dynamic state (in-situ condition). The XAFS can provide information that is not accessible by other techniques for characterization of materials, particularly catalysts and related surfaces. Furthermore, XAFS can provide a molecular-level approach to the study of reaction mechanisms for the understanding of catalysts and development of new catalysts. A number of synchrotron radiation facilities have been planned to be built in Asian countries in addition to the high-brilliant synchrotron radiation facilities under construction in the USA, Europe, and Japan. The applications of XAFS have now expanded to catalytic chemistry and engineering, surface science, organometallic chemistry, materials science, solid-state chemistry, geophysics, etc. This book caters to a wide range of researchers and students working in the domain or related topics.
 
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