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Fundamentals of Electromigration-Aware Integrated Circuit Design Softcover Repri Edition
Contributor(s): Lienig, Jens (Author), Thiele, Matthias (Author)

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ISBN: 3030088111     ISBN-13: 9783030088118
Publisher: Springer
OUR PRICE: $94.99  

Binding Type: Paperback - See All Available Formats & Editions
Published: December 2018
Temporarily out of stock - Will ship within 2 to 5 weeks
Additional Information
BISAC Categories:
- Technology & Engineering | Electronics - Circuits - General
- Computers | Systems Architecture - General
- Computers | Hardware - Mainframes & Minicomputers
Dewey: 004.1
Physical Information: 0.4" H x 8.4" W x 9.2" L (0.50 lbs) 159 pages
Descriptions, Reviews, Etc.
Publisher Description:

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration's negative impact on circuit reliability.

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