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Atomic Resolution Microscopy of Surfaces and Interfaces: Volume 466
Contributor(s): Smith, David J. (Editor)

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 ISBN: 1558993703     ISBN-13: 9781558993709
Publisher: Materials Research Society
OUR PRICE: $27.54  

Binding Type: Hardcover
Published: September 1997
* Out of Print *

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Additional Information
BISAC Categories:
- Science | Nanoscience
- Technology & Engineering | Materials Science - General
Dewey: 620.112
LCCN: 97029693
Series: Materials Research Society Symposium Proceedings (Hardcover)
Physical Information: 0.8" H x 6.1" W x 9.2" L (1.25 lbs) 282 pages
 
Descriptions, Reviews, Etc.
Publisher Description:
The past several years have witnessed a considerable expansion in the breadth and depth of studies involving scanning tunneling microscopy and high-resolution electron microscopy. The purpose of this volume is to highlight recent developments and applications of atomic-resolution imaging methods to surfaces and bulk defects. Papers from a range of scientific and engineering disciplines are presented. Recent advances in imaging techniques, including quantitative image matching, are emphasized. Applications to ceramics, intermetallics and semiconductor surface reconstructions are also featured.
 
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